DocumentCode :
1394596
Title :
Electro-thermal and logi-thermal simulation of VLSI designs
Author :
Székely, Vladimir ; Poppe, András ; Páhi, András ; Csendes, Alpár ; Hajas, Gábor ; Rencz, Márta
Author_Institution :
Dept. of Electron Devices, Tech. Univ. Budapest, Hungary
Volume :
5
Issue :
3
fYear :
1997
Firstpage :
258
Lastpage :
269
Abstract :
Due to severe thermal problems of today´s VLSI integrated circuits the need for reliable and quick thermal, electro-thermal and logi-thermal simulation tools is increasing, In this paper, we discuss the latest advances in the SISSI package (simulator for integrated structures by simultaneous iteration) which is a tool developed originally for analog VLSI design. The improvements include electro-thermal ac and transient simulation and the consideration of the thermal voltage of Si-Al contacts. Furthermore, we introduce a new module of SISSI, LOGITHERM, which is aimed at the self-consistent logic and thermal simulation of large digital VLSI designs. The features of our simulator package are highlighted by simulation examples that are compared in most cases with measurement results.
Keywords :
VLSI; circuit analysis computing; digital simulation; integrated circuit design; integrated circuit modelling; iterative methods; logic CAD; transient analysis; LOGITHERM; SISSI package; ac simulation; digital VLSI designs; electro-thermal simulation; logi-thermal simulation; self-consistent logic; simultaneous iteration; thermal voltage; transient simulation; Circuit simulation; Coupling circuits; Integrated circuit measurements; Integrated circuit packaging; Integrated circuit reliability; Logic design; Semiconductor device measurement; Temperature; Very large scale integration; Voltage;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.609868
Filename :
609868
Link To Document :
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