• DocumentCode
    1394618
  • Title

    Get a clear view of simulated and measured data

  • Author

    Ceraolo, Massimo

  • Author_Institution
    Pisa Univ., Italy
  • Volume
    13
  • Issue
    4
  • fYear
    2000
  • fDate
    10/1/2000 12:00:00 AM
  • Firstpage
    36
  • Lastpage
    42
  • Abstract
    Present-day operating systems have graphical user interfaces (GUI) that are of great help in designing good user interfaces for application programs. Also, there have been dramatic improvements in computer power and power-to-price ratio. Acknowledgement is growing, even in technical environments, that good man-machine interfaces (MMI) have so many advantages that they are worth the effort of design and implementation. A good MMI can reduce the chance of making trivial errors that could be detected only very late during the simulation process, resulting in a great deal of wasted time. Nevertheless, in the electrical engineering community, programs that are not optimal on the MMI side are still in use. This article focuses on a study of the MMI main issues for a plotting program to visualize simulation and measurement data effectively. The resulting program, PlotXY, was developed in the rapid application development (RAD) environment of Borland C++ Builder, which is distributed for free and described in this article, along with the main ideas behind its interface
  • Keywords
    data visualisation; electrical engineering computing; graphical user interfaces; software engineering; Borland C++ Builder; GUI; PlotXY; application programs; data visualisation; electrical engineering; graphical user interfaces; man-machine interfaces; measured data; operating systems; plotting program; rapid application development; simulated data; Application software; Computational modeling; Computer errors; Computer interfaces; EMTP; Graphical user interfaces; Man machine systems; Operating systems; User interfaces; Voltage;
  • fLanguage
    English
  • Journal_Title
    Computer Applications in Power, IEEE
  • Publisher
    ieee
  • ISSN
    0895-0156
  • Type

    jour

  • DOI
    10.1109/67.876869
  • Filename
    876869