Title :
Statistical estimation of delay-dependent switching activities in embedded CMOS combinational circuits
Author :
Lim, Yong Je ; Soma, Mani
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
This paper describes a new procedure to estimate the delay-dependent switching activities in CMOS combinational circuits. The procedure is based on analytic and statistical approaches to take advantage of their time-efficiency over conventional event-driven simulation tools. For this study, combinational circuits driven by discrete-time logic signals are considered. By focusing on a specific class of combinational circuits, the transitional effects can be analyzed more accurately by considering some of the delay effects neglected in previous studies, Also, to model the delay-dependent effects, statistical properties such as the pattern probability, the propagation probability, and the distribution of the propagation delay of switching activities are defined and evaluated. The simulation results on benchmark circuits indicate that the proposed procedure significantly speeds up the estimation process in comparison to the conventional event-driven simulators. The reliability issues in the aspect of switching activities are briefly discussed.
Keywords :
CMOS logic circuits; circuit analysis computing; combinational circuits; delays; hot carriers; integrated circuit reliability; statistical analysis; benchmark circuits; delay-dependent effects; delay-dependent switching activities; discrete-time logic signals; embedded CMOS combinational circuits; estimation process; pattern probability; propagation probability; reliability issues; time-efficiency; transitional effects; Analytical models; CMOS logic circuits; Circuit simulation; Combinational circuits; Delay effects; Delay estimation; Discrete event simulation; Probability; Propagation delay; Switching circuits;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on