• DocumentCode
    1394655
  • Title

    Alpha-Particle Emission Energy Spectra From Materials Used for Solder Bumps

  • Author

    Gordon, Michael S. ; Rodbell, Kenneth P. ; Heidel, David F. ; Murray, Conal E. ; Tang, Henry H K ; Dwyer-McNally, Brendan ; Warburton, William K.

  • Author_Institution
    IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    57
  • Issue
    6
  • fYear
    2010
  • Firstpage
    3251
  • Lastpage
    3256
  • Abstract
    The emitted alpha particle energy distribution from solder bumps can show substantial surface emission which has a large impact on the modeled SEU rate. State-of-the art alpha-particle detectors are required to measure the low emissivity and energy distribution.
  • Keywords
    alpha-particle effects; alpha-particle spectra; ion emission; surface charging; tin alloys; SnJkJk; alpha particle detectors; alpha particle emission energy spectra; emissivity measurement; energy distribution measurement; single event upset rate; solder bump materials; surface emission; Alpha particles; Ionization; Radiation detectors; Single event upset; Alpha particles; energy spectrum; ionization detectors; low-background; solder bumps;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2010.2085015
  • Filename
    5658038