• DocumentCode
    1394668
  • Title

    Analysis of order statistic filters applied to ultrasonic flaw detection using split-spectrum processing

  • Author

    Saniie, Jafar ; Nagle, Daniel T. ; Donohue, Kevin D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • Volume
    38
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    133
  • Lastpage
    140
  • Abstract
    Split-spectrum processing of broadband ultrasonic signals coupled with order statistic filtering has proven to be effective in improving the flaw-to-clutter ratio of backscattered signals. It is shown that an optimal rank can be obtained with a prior knowledge of flaw-to-clutter ratio and the underlying distributions. The order statistic filter performs well where the flaw and clutter echoes have good statistical separation in a given quantile region representing a particular rank (e.g. minimum, median, maximum). Order statistic filters are analyzed for the situation in which the observations do not contain equivalent statistical information. Experimental and simulated results are presented to show how effectively the order statistic filter can utilize information contained in different frequency bands to improve flaw detection.<>
  • Keywords
    acoustic filters; acoustic signal processing; filtering and prediction theory; flaw detection; spectral analysis; statistical analysis; ultrasonic materials testing; NDT; backscattered signals; broadband ultrasonic signals; flaw-to-clutter ratio; optimal rank; order statistic filtering; split-spectrum processing; ultrasonic flaw detection; Band pass filters; Filtering; Frequency diversity; Radar detection; Radar scattering; Rayleigh scattering; Signal processing; Statistical analysis; Statistical distributions; Ultrasonic imaging;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.68470
  • Filename
    68470