A prescription for THz transistor characterization

Author

Williams, Dylan F.

fYear

2014

fDate

2-4 April 2014

Firstpage

1

Lastpage

1

Abstract

Summary form only given: Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter-wave, and even terahertz frequencies. Dr. Dylan Williams, winner of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement, will trace the history of on-wafer measurements, discuss the fundamental principles behind on-wafer measurements and tell you everything you need to know about how to make accurate on-wafer measurements from DC to THz frequencies.

Keywords

microwave measurement; microwave transistors; millimetre wave transistors; network analysers; submillimetre wave transistors; DC frequencies; THz transistor characterization; microwave frequencies; microwave metrology; microwave wafer probes; millimeter-wave frequencies; on-wafer measurements; printed transmission lines; submillimeter-wave frequencies; terahertz frequencies; vector network analyzers; Frequency measurement; Microwave measurement; Microwave transistors; Millimeter wave measurements; Transistors; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC), 2014 International Workshop on

Conference_Location

Leuven

Type

conf

DOI

10.1109/INMMIC.2014.6815113

Filename

6815113