Investigations of single-event upsets and charge collection in micro-electronics using variable-length laser-generated charge tracks

Author

Melinger, J.S. ; McMorrow, D. ; Buchner, S. ; Knudson, A.R. ; Tran, L.H. ; Campbell, A.B.

Author_Institution

Naval Res. Lab., Washington, DC, USA

Volume

45

Issue

3

fYear

1998

fDate

6/1/1998 12:00:00 AM

Firstpage

1487

Lastpage

1493

Abstract

In this paper we examine how single-event upsets (SEU) and related charge collection characteristics in microelectronic circuits and devices depend on the depth of charge deposited by a picosecond laser pulse. Charge tracks of variable length are generated by tuning the laser wavelength through the semiconductor absorption spectrum. Our results show that the variable-length charge tracks provide a unique and sensitive probe of the charge collection volume of a micro-electronic circuit/device. In favorable cases we show how the wavelength tunability of the laser can be used to provide an experimental estimate of the charge collection depth

Keywords

integrated circuit technology; laser beam effects; particle tracks; charge collection; charge track; microelectronic circuit; picosecond laser pulse irradiation; semiconductor absorption spectrum; single event upset; wavelength tunability; Absorption; Circuit optimization; Laser tuning; Microelectronics; Optical pulses; Probes; Pulse circuits; Pulsed laser deposition; Semiconductor lasers; Single event upset;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.685228

Filename

685228