DocumentCode :
1394935
Title :
Electrical and optical response of a Mach-Zehnder electrooptical modulator to pulsed irradiation
Author :
Hose, C.D. ; Cassan, E. ; Baggio, J. ; Musseau, O. ; Leray, J.L.
Author_Institution :
CEA, Bruyeres-le-Chatel, France
Volume :
45
Issue :
3
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
1524
Lastpage :
1530
Abstract :
Radiation hardness of LiNbO3:Ti Mach Zehnder optomodulators under high energy electron pulses at high dose rate is studied for the first time. Both electrical and optical measurements are performed at various dose rates and electrical bias conditions. Electrical and optical perturbations are observed to be synchronous of the irradiation pulse, below a total dose threshold of 1 krad(Si). The optical behavior of the various optomodulators under test is related to their structure. As a matter of fact, optical perturbations are due either to photocurrent which superposes to electrical bias, or to an alteration of couplers characteristics
Keywords :
Mach-Zehnder interferometers; electro-optical modulation; electron beam effects; lithium compounds; radiation hardening (electronics); titanium; 1 krad; LiNbO3:Ti; Mach-Zehnder electrooptical modulator; coupler; electrical response; optical response; photocurrent; pulsed electron irradiation; radiation hardness; Electron optics; Electrooptic modulators; Optical attenuators; Optical crosstalk; Optical modulation; Optical pulses; Optical refraction; Optical sensors; Optical variables control; Pulse modulation;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.685234
Filename :
685234
Link To Document :
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