• DocumentCode
    1394938
  • Title

    High voltage silicon power device structure with substrate bias

  • Author

    Li, Qifeng ; Wang, W.D. ; Li, H.O. ; Wei, X.M.

  • Author_Institution
    Guangxi Key Lab. of Wireless Wideband Commun. & Signal Process., Guilin Univ. of Electron. Technol., Guilin, China
  • Volume
    47
  • Issue
    25
  • fYear
    2011
  • Firstpage
    1394
  • Lastpage
    1396
  • Abstract
    A new high voltage silicon LDMOS structure with substrate bias is reported (SB S-LDMOS). The vertical conduction path is blocked by the double p-/n+ layer substrate when positive substrate bias is applied to the SB S-LDMOS. The bulk electric field in the drift region redistributes by substrate bias and the vertical voltage sustained by the depletion region under drain decreases significantly, which is especially important for a thin drift region power device. Numerical results indicate that the breakdown voltage of the proposed device is increased by 94% compared to conventional LDMOS, while maintaining low on-resistance.
  • Keywords
    MIS devices; MIS structures; elemental semiconductors; power semiconductor devices; silicon; Si; bulk electric field; double p--n+ layer substrate; drift region redistribution; high voltage silicon LDMOS structure; high voltage silicon power device structure; vertical conduction path;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2011.3065
  • Filename
    6099141