Title :
Improved blades for RF testing at wafer level
Author_Institution :
Dept. of Ind. Eng., Istanbul Sehir Univ., Uskudar-Istanbul, Turkey
Abstract :
An improved design for a blade utilised in a probe card is presented. The comparison is made with a current blade design and prototype test cards were manufactured for the study. Measurement results on S-parameters are reported on test cards with the new design and new blade material.
Keywords :
blades; circuit testing; printed circuit accessories; printed circuits; probes; test equipment; RF testing; S-parameters; blade design; blade material; probe card; prototype test cards; wafer level;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2011.2563
