• DocumentCode
    1395061
  • Title

    InGaN-based blue laser diodes

  • Author

    Nakamura, Shuji

  • Author_Institution
    Dept. of Res. & Dev., Nichia Chem. Ind. Ltd., Tokushima, Japan
  • Volume
    3
  • Issue
    3
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    712
  • Lastpage
    718
  • Abstract
    The continuous-wave (CW) operation of InGaN multiquantum-well (MQW) structure laser diodes (LDs) was demonstrated at room temperature (RT) with a lifetime of 100 h. The threshold current and the voltage of the LDs were 50 mA and 5 V, respectively. The threshold current density was 8.8 kA/cm2. The carrier lifetime and the threshold carrier density were estimated to be 3.5 ns and 1.8×1020/cm3, respectively. The Stokes shift of the energy difference between the absorption and the emission energy of the InGaN MQW LD´s were 140 meV. Both spontaneous and stimulated emission of the LD´s originated from this deep localized energy state which is equivalent to a quantum dot-like state. From the measurements of gain spectra and an external differential quantum efficiency dependence on the cavity length, the differential gain coefficient, the transparent carrier density, threshold gain and internal loss were estimated to be 5.8×10-17 cm2, 9.3×10 19 cm-3, 5200 cm-1, and 43 cm-1 respectively
  • Keywords
    III-V semiconductors; carrier density; carrier lifetime; current density; gallium compounds; indium compounds; quantum well lasers; spontaneous emission; stimulated emission; 100 h; 140 meV; 3.5 ns; 5 V; 50 mA; CW lasers; InGaN; InGaN MQW LD´s; InGaN multiquantum-well laser diodes; InGaN-based blue laser diodes; Stokes shift; absorption energy; carrier lifetime; cavity length; continuous-wave operation; deep localized energy state; differential gain coefficient; emission energy; external differential quantum efficiency dependence; gain spectra; quantum dot-like state; room temperature; spontaneous emission; stimulated emission; threshold carrier density; threshold current; threshold current density; threshold voltage; Absorption; Charge carrier density; Charge carrier lifetime; Diode lasers; Life estimation; Lifetime estimation; Quantum well devices; Temperature; Threshold current; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/2944.640626
  • Filename
    640626