• DocumentCode
    1395331
  • Title

    Investigation of cathode spots and plasma formation of vacuum arcs by high speed microscopy and spectroscopy

  • Author

    Siemroth, Peter ; Schülke, Thomas ; Witke, Thomas

  • Author_Institution
    Fraunhofer-Inst. for Mater. & Beam Technol., Dresden, Germany
  • Volume
    25
  • Issue
    4
  • fYear
    1997
  • fDate
    8/1/1997 12:00:00 AM
  • Firstpage
    571
  • Lastpage
    579
  • Abstract
    Though vacuum arc cathode spot has been under investigation for more than a century, its structure and operation is still discussed controversially. Experimentally measured parameters and descriptions of the visible structures given by different authors are far from fitting into an uniform picture. In the present paper, the wide range of findings, parameter values, and phenomenological descriptions will be explained as different semblances of a complex structured object. The random behavior of the spot related parameters, mostly stated as a factor complicating their accessibility, gives the key for a better understanding of its nature. It will be shown that the arc spot may be characterized by the statistical self-similarity of its structure. Recognizing fractal structures as one of the main features of the arc spot, its similarity on different spatial scales is understandable. Scale dependent values of structure dimensions and time constants are inevitable consequences of that “fractal picture.”
  • Keywords
    cathodes; high-speed optical techniques; optical microscopy; plasma diagnostics; time resolved spectra; vacuum arcs; cathode spots; fractal structures; high speed microscopy; high speed spectroscopy; plasma formation; random behavior; spot related parameters; statistical self-similarity; vacuum arcs; visible structures; Cathodes; Fractals; Optical scattering; Plasma applications; Plasma measurements; Scanning electron microscopy; Spatial resolution; Spectroscopy; Vacuum arcs; Vacuum technology;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.640667
  • Filename
    640667