Title :
Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave—Part II: Analysis and Validation
Author :
Lagos, Jorge L. ; Fiori, Franco
Author_Institution :
Dept. of Electron., Politec. di Torino, Turin, Italy
fDate :
5/1/2011 12:00:00 AM
Abstract :
In the companion paper [1], an algorithm to calculate the worst case-induced voltages at the terminations of a uniform microstrip line illuminated by an electromagnetic plane wave has been presented. Here, this algorithm is used to calculate the worst case voltage at the ends of a microstrip line terminated by real analog and digital transceivers. Specifically, the influence of the microstrip design parameters and termination impedances on the induced voltage magnitude is analyzed and some design criteria are pointed out.
Keywords :
electromagnetic interference; microstrip lines; transceivers; analog transceivers; digital transceivers; electromagnetic plane wave; microstrip interchip interconnects; uniform microstrip line; worst case-induced disturbances; Impedance; Integrated circuit interconnections; Integrated circuit modeling; Iron; Microstrip; Receivers; Resonant frequency; Electromagnetic interference (EMI); interconnects; microstrip line; printed circuit board; susceptibility;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2010.2089566
