• DocumentCode
    1395369
  • Title

    A New Intelligent Autoreclosing Scheme Using Artificial Neural Network and Taguchi´s Methodology

  • Author

    Zahlay, Fitiwi Desta ; Rao, K. S Rama ; Ibrahim, Taib B.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. Teknol. PETRONAS, Tronoh, Malaysia
  • Volume
    47
  • Issue
    1
  • fYear
    2011
  • Firstpage
    306
  • Lastpage
    313
  • Abstract
    This paper presents a novel intelligent autoreclosure technique to discriminate temporary faults from permanent faults and accurately determine fault extinction time. A variety of fault simulations are carried out on a specified transmission line on the standard IEEE 9-bus electric power system using MATLAB/SimPowerSytems. FFT and Prony analysis methods are employed to extract data features from each simulated fault. The fault identification prior to reclosing is accomplished by an artificial neural network trained by standard Error Back-Propagation, Levenberg Marquardt, and Resilient Back-Propagation algorithms which are developed using MATLAB. Some important parameters which strongly affect the entire training process are fine tuned with Taguchi´s method to their corresponding best values. The robustness of the developed ANN identifier is verified by testing it with the data patterns which consists of high impedance faults obtained from IEEE 14-bus benchmark system. Test results show the efficacy of the proposed AR scheme.
  • Keywords
    Taguchi methods; backpropagation; neural nets; power transmission faults; power transmission lines; FFT; IEEE 14-bus benchmark system; IEEE 9-bus electric power system; MATLAB-SimPowerSytem; Prony analysis method; Taguchi methodology; artificial neural network; data feature extraction; fault extinction time; fault simulations; impedance faults; intelligent autoreclosing scheme; permanent faults; transmission line; Artificial neural networks; Circuit faults; Feature extraction; Harmonic analysis; Power transmission lines; Training; Transient analysis; Adaptive automatic reclosure; Error Back Propagation (EBP); Levenberg Marquardt (LM); Resilient Back-Propagation; Taguchi´s method; artificial neural networks (ANNs);
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2010.2090936
  • Filename
    5658141