DocumentCode :
1395369
Title :
A New Intelligent Autoreclosing Scheme Using Artificial Neural Network and Taguchi´s Methodology
Author :
Zahlay, Fitiwi Desta ; Rao, K. S Rama ; Ibrahim, Taib B.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Teknol. PETRONAS, Tronoh, Malaysia
Volume :
47
Issue :
1
fYear :
2011
Firstpage :
306
Lastpage :
313
Abstract :
This paper presents a novel intelligent autoreclosure technique to discriminate temporary faults from permanent faults and accurately determine fault extinction time. A variety of fault simulations are carried out on a specified transmission line on the standard IEEE 9-bus electric power system using MATLAB/SimPowerSytems. FFT and Prony analysis methods are employed to extract data features from each simulated fault. The fault identification prior to reclosing is accomplished by an artificial neural network trained by standard Error Back-Propagation, Levenberg Marquardt, and Resilient Back-Propagation algorithms which are developed using MATLAB. Some important parameters which strongly affect the entire training process are fine tuned with Taguchi´s method to their corresponding best values. The robustness of the developed ANN identifier is verified by testing it with the data patterns which consists of high impedance faults obtained from IEEE 14-bus benchmark system. Test results show the efficacy of the proposed AR scheme.
Keywords :
Taguchi methods; backpropagation; neural nets; power transmission faults; power transmission lines; FFT; IEEE 14-bus benchmark system; IEEE 9-bus electric power system; MATLAB-SimPowerSytem; Prony analysis method; Taguchi methodology; artificial neural network; data feature extraction; fault extinction time; fault simulations; impedance faults; intelligent autoreclosing scheme; permanent faults; transmission line; Artificial neural networks; Circuit faults; Feature extraction; Harmonic analysis; Power transmission lines; Training; Transient analysis; Adaptive automatic reclosure; Error Back Propagation (EBP); Levenberg Marquardt (LM); Resilient Back-Propagation; Taguchi´s method; artificial neural networks (ANNs);
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2010.2090936
Filename :
5658141
Link To Document :
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