• DocumentCode
    1395448
  • Title

    Self-affine mapping system and its application to object contour extraction

  • Author

    Ida, Takashi ; Sambonsugi, Yoko

  • Author_Institution
    Multimedia Lab., Toshiba Corp., Kawasaki, Japan
  • Volume
    9
  • Issue
    11
  • fYear
    2000
  • fDate
    11/1/2000 12:00:00 AM
  • Firstpage
    1926
  • Lastpage
    1936
  • Abstract
    A self-affine mapping system which has conventionally been used to produce fractal images is used to fit rough lines to contours. The self-affine map´s parameters are detected by analyzing the blockwise self-similarity of a grayscale image using a simplified algorithm in fractal encoding. The phenomenon that edges attract mapping points in self-affine mapping is utilized in the proposed method. The boundary of the foreground region of an alpha mask is fitted by mapping iterations of the region. It is shown that the proposed method accurately produces not only smooth curves but also sharp corners, and has the ability to extract both distinct edges and blurred edges using the same parameter. It is also shown that even large gaps between the hand-drawn line and the contour can be fitted well by the recursive procedure of the proposed algorithm, in which the block size is progressively decreased. These features reduce the time required for drawing contours by hand
  • Keywords
    edge detection; feature extraction; fractals; image segmentation; iterative methods; alpha mask; blockwise self-similarity; blurred edges; distinct edges; foreground region; fractal encoding; fractal images; grayscale image; iterations; mapping points; object contour extraction; recursive procedure; rough lines; self-affine mapping system; sharp corners; smooth curves; Algorithm design and analysis; Chaotic communication; Fractals; Gray-scale; Helium; Image analysis; Image coding; Image edge detection; Image segmentation; Image storage;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/83.877213
  • Filename
    877213