• DocumentCode
    1395563
  • Title

    Least Squares Estimation and Cramér–Rao Type Lower Bounds for Relative Sensor Registration Process

  • Author

    Fortunati, Stefano ; Farina, Alfonso ; Gini, Fulvio ; Graziano, Antonio ; Greco, Maria S. ; Giompapa, Sofia

  • Author_Institution
    Dept. of Ing. dell´´Inf., Univ. of Pisa, Pisa, Italy
  • Volume
    59
  • Issue
    3
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    1075
  • Lastpage
    1087
  • Abstract
    An important prerequisite for successful multisensor integration is that the data from the reporting sensors are transformed to a common reference frame free of systematic or registration bias errors. If not properly corrected, the registration errors can seriously degrade the global surveillance system performance by increasing tracking errors and even introducing ghost tracks. The relative sensor registration (or grid-locking) process aligns remote data to local data under the assumption that the local data are bias free and that all biases reside with the remote sensor. In this paper, we consider all registration errors involved in the grid-locking problem, i.e., attitude, measurement, and position biases. A linear least squares (LS) estimator of these bias terms is derived and its statistical performance compared to the hybrid Cramér-Rao lower bound (HCRLB) as a function of sensor locations, sensors number, and accuracy of sensor measurements.
  • Keywords
    least squares approximations; sensor fusion; Cramér-Rao lower bound; Cramer-Rao type lower bounds; ghost track; global surveillance system performance; grid-locking problem; least squares estimation; linear least squares estimator; multisensor integration; registration bias error; relative sensor registration process; remote sensor; sensor location; sensor measurement; tracking error; CRLB; HCRLB; grid-locking process; multisensor system; sensor registration; target tracking;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2010.2097258
  • Filename
    5658170