DocumentCode :
1395913
Title :
Improvement of surface flashover performance in vacuum by co-firing Mo/Al2O3 cermets and Al2O3 ceramics
Author :
Li, Shengtao ; Zhang, Tuo ; Sun, Jian ; Huang, Qifeng ; Li, Jianying
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
Volume :
17
Issue :
6
fYear :
2010
Firstpage :
1931
Lastpage :
1937
Abstract :
A new insulation structure of Mo/Al2O3 cermet-Al2O32 ceramic-Mo/Al2O3 cermet was designed to improve the surface flashover performance in vacuum through co-firing, where the volume addition of metal Mo was managed from 2 vol% to 50 vol% and there could exist one or two layers with different Mo addition in Mo/Al2O3 cermet. The influences of Mo addition of Mo/Al2O3 cermet on the surface flashover voltage in vacuum of samples were experimentally investigated, indicating that the surface flashover voltage of three and five-layer structures were improved by 77% and 117%, respectively. Through electrostatic field simulation, it was found that the improvement is caused by the weakening of the electric field at vacuum-insulator-cathode triple junction. On the basis of an in-depth investigation, it was also concluded that Mo particles of Mo/Al2O3 cermet layer can decline the surface charging and secondary electron emission near the triple junction. Then with a further increase of Mo addition, the decreasing trend of flashover voltage after the growing has been reasonably explained by investigating the configuration of Mo particles in Mo/Al2O3 cermet.
Keywords :
aluminium compounds; ceramics; cermets; electric fields; molybdenum; cermets; cofiring; electrostatic field simulation; surface flashover performance; surface flashover voltage; vacuum-insulator-cathode triple junction; Aluminum oxide; Ceramics; Electric fields; Flashover; Insulators; Junctions; Surface charging; Surface flashover in vacuum, Mo/Al2O3 cermet, triple junction, cofiring, secondary electron;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2010.5658248
Filename :
5658248
Link To Document :
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