Title :
Self-starting 6.5-fs pulses from a Ti:sapphire laser using a semiconductor saturable absorber and double chirped mirrors
Author :
Sutter, Dirk H. ; Jung, Isabella D. ; Kärtner, Franz X. ; Matuschek, Nicolai ; Morier-Genoud, François ; Scheuer, V. ; Tilsch, M. ; Tschudi, T. ; Keller, Ursula
Author_Institution :
Inst. for Quantum Electron., Fed. Inst. of Technol., Zurich, Switzerland
Abstract :
We demonstrate self-starting 6.5-fs pulses from a Kerr-lens-mode-locked Ti:sapphire laser with an average output power of 200 mW at a pulse repetition rate of 86 MHz. We have achieved a mode-locking buildup time of only 60 μs, using a broad-band semiconductor saturable absorber mirror to initiate the pulse formation. The dispersion has been compensated with a prism pair in combination with improved double-chirped mirrors. The prism pair allows for the flexible adjustment of both the duration and the center wavelength of the pulse. The double-chirped mirrors show a high reflectivity better than 99.8% over the full bandwidth of 300 nm and a controlled group delay over more than 250 nm. The choice of a proper output coupler turns out to be critical for ultrashort pulse generation directly from the laser
Keywords :
chirp modulation; high-speed optical techniques; laser mirrors; laser mode locking; optical couplers; optical dispersion; optical modulation; optical saturable absorption; reflectivity; sapphire; solid lasers; titanium; 200 mW; 6.5 fs; 6.5 ps; 60 mus; Kerr-lens-mode-locked Ti:sapphire laser; Ti:sapphire laser; average output power; broad-band semiconductor saturable absorber mirror; center wavelength; double-chirped mirrors; full bandwidth; high reflectivity; mode-locking buildup time; output coupler; prism pair; pulse formation; pulse repetition rate; self-starting fs pulses; ultrashort pulse generation; Bandwidth; Delay; Laser mode locking; Mirrors; Optical pulse generation; Optical pulses; Power generation; Power lasers; Reflectivity; Semiconductor lasers;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.686720