A novel technique for high impedance fault identification

Author

Wai, David Chan Tat ; Xia Yibin

Author_Institution

Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore

Volume

13

Issue

3

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

738

Lastpage

744

Abstract

A novel technique using wavelet analysis filter banks (WAFB) to identify distribution high impedance faults (HIFs) is presented. A new model of HIF is used. HIFs and capacitor bank switching operations are simulated by the Electromagnetic Transients Program (EMTP) and their current signals are studied. High frequency components with the time localization information of both HIFs and capacitor bank switching operations are obtained using WAFB and their behavior is differentiated clearly. Results demonstrate that WAFB can be used as an element in a HIF detector for fast and accurate identification of distribution HIFs

Keywords

capacitor storage; digital simulation; distribution networks; electric impedance; fault location; power system analysis computing; switching; wavelet transforms; EMTP; Electromagnetic Transients Program; capacitor bank switching operations; current signals; distribution high impedance faults; high impedance fault identification; time localization; wavelet analysis filter banks; Capacitors; Fault diagnosis; Filter bank; Finite impulse response filter; Fourier transforms; Frequency domain analysis; Impedance; Transient analysis; Wavelet analysis; Wavelet transforms;

fLanguage

English

Journal_Title

Power Delivery, IEEE Transactions on

Publisher

ieee

ISSN

0885-8977

Type

jour

DOI

10.1109/61.686968

Filename

686968