Title :
A novel technique for high impedance fault identification
Author :
Wai, David Chan Tat ; Xia Yibin
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
fDate :
7/1/1998 12:00:00 AM
Abstract :
A novel technique using wavelet analysis filter banks (WAFB) to identify distribution high impedance faults (HIFs) is presented. A new model of HIF is used. HIFs and capacitor bank switching operations are simulated by the Electromagnetic Transients Program (EMTP) and their current signals are studied. High frequency components with the time localization information of both HIFs and capacitor bank switching operations are obtained using WAFB and their behavior is differentiated clearly. Results demonstrate that WAFB can be used as an element in a HIF detector for fast and accurate identification of distribution HIFs
Keywords :
capacitor storage; digital simulation; distribution networks; electric impedance; fault location; power system analysis computing; switching; wavelet transforms; EMTP; Electromagnetic Transients Program; capacitor bank switching operations; current signals; distribution high impedance faults; high impedance fault identification; time localization; wavelet analysis filter banks; Capacitors; Fault diagnosis; Filter bank; Finite impulse response filter; Fourier transforms; Frequency domain analysis; Impedance; Transient analysis; Wavelet analysis; Wavelet transforms;
Journal_Title :
Power Delivery, IEEE Transactions on
