DocumentCode :
1397147
Title :
A Fast ULV Logic Synthesis Flow in Many- V_{t} CMOS Processes for Minimum Energy Under Timing Constraints
Author :
Bol, David ; Hocquet, Cedric ; Regazzoni, Francesco
Author_Institution :
ICTEAM Inst., Univ. catholique de Louvain, Louvain-la-Neuve, Belgium
Volume :
59
Issue :
12
fYear :
2012
Firstpage :
947
Lastpage :
951
Abstract :
Ultra-low-voltage (ULV) logic offers the opportunity to operate at the minimum-energy point (MEP) for applications with low-to-medium speed requirements. Unfortunately, the critical design constraint of achieving a reliable timing closure at the target frequency of the application becomes very complex in the wide design space of ULV including supply (Vdd) and threshold (Vt) voltage selection as well as netlist optimizations from the synthesis. In this paper, we propose a fast synthesis flow to accurately predict the Vdd/Vt MEP under strict timing constraints. Compared to an exhaustive search for the MEP under timing constraints based on numerous library recharacterizations and synthesis steps for all Vdd/Vt pairs, the proposed ULV flow dramatically speeds up the design process. Indeed, it requires a single library recharacterization and only three synthesis steps. Results obtained for several ITC´99 benchmarks under a wide range of timing constraints from 0.1 to 30 MHz in 65-nm LP/GP CMOS demonstrate that the proposed flow has a less than 10% energy penalty with respect to the absolute MEP computed with an exhaustive search and energy savings enhanced up to 2.4× compared to a conventional flow with Vdd scaling only.
Keywords :
CMOS logic circuits; circuit optimisation; logic design; ITC´99 benchmarks; MEP; MEP under timing constraints; critical design constraint; energy savings; fast ULV logic synthesis flow; frequency 0.1 MHz to 30 MHz; many-voltage CMOS process; minimum energy under timing constraints; minimum-energy point; netlist optimizations; single library recharacterization; size 65 nm; threshold voltage selection; ultralow-voltage logic; Data models; Delays; Design automation; Digital integrated circuits; Integrated circuit modeling; Low power electronics; Low voltage; Optimization; Voltage control; Design automation; digital integrated circuits; timing closure; ultra-low power; ultra-low voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2012.2231034
Filename :
6409429
Link To Document :
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