Identification of parameters in multilayer media

Author

Torre, Edward Della ; Fry, Richard A. ; Alejos, Oscar ; Cardelli, Ermanno

Author_Institution

Dept. of Electr. & Comput. Eng., George Washington Univ., Washington, DC, USA

Volume

36

Issue

4

fYear

2000

fDate

7/1/2000 12:00:00 AM

Firstpage

1272

Lastpage

1275

Abstract

Multilayer media are of increasing importance as magneto-optic and perpendicular media. The properties of successive layers evolve as the layers are epitaxially deposited. This complicates both the model for these media and the identification of the model parameters. In this paper, the effect of the variation of the Preisach model parameters is discussed and an identification procedure is outlined. Reentrant-type hysteresis behavior, which is found to be necessary in order to accurately fit both major loop and first-order reversal curves in these multilayer materials, is also considered

Keywords

magnetic epitaxial layers; magnetic hysteresis; magnetic multilayers; Preisach model parameters; first-order reversal curves; identification procedure; magneto-optic media; model parameters; multilayer media parameters; perpendicular media; reentrant-type hysteresis behavior; Coercive force; Epitaxial growth; Magnetic field measurement; Magnetic hysteresis; Magnetic materials; Magnetic multilayers; Magnetooptic effects; NIST; Nonhomogeneous media; Semiconductor process modeling;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.877672

Filename

877672