DocumentCode :
1397290
Title :
Hebbian plasticity in MOS synapses
Author :
Card, H.C. ; Schneider, C.R. ; Moore, W.R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
Volume :
138
Issue :
1
fYear :
1991
fDate :
2/1/1991 12:00:00 AM
Firstpage :
13
Lastpage :
16
Abstract :
Hebbian learning in analogue CMOS synapses is obtained by using the transistor characteristics to approximate the multiplicative correlation of neural signals. In situ analogue learning is employed, which means that computations of synaptic weight changes occur continuously during the normal operation of the artificial neural network. The transistor complexity of a synapse is minimised by departing from strict adherence to classical multiplicative rules; learning remains consistent, however, with the original qualitative statement of Hebb. Simulations of circuits with three transistors per synapse in the case of unipolar weights suggest that appropriate learning and forgetting behaviour is obtained at the synaptic level by adopting these area-efficient MOS learning rules in lieu of classical analytical formulations. The theory at the systems level corresponding to these learning rules has not yet been developed
Keywords :
CMOS integrated circuits; VLSI; analogue circuits; learning systems; linear integrated circuits; neural nets; Hebb; Hebbian learning; VLSI; analogue CMOS; artificial neural network; forgetting behaviour; learning systems; multiplicative correlation; neural nets; synaptic weight changes;
fLanguage :
English
Journal_Title :
Radar and Signal Processing, IEE Proceedings F
Publisher :
iet
ISSN :
0956-375X
Type :
jour
Filename :
87769
Link To Document :
بازگشت