Title :
Noise in optical low-coherence reflectometry
Author :
Takada, Kazumasa
Author_Institution :
NTT Opto-Electron. Labs., Ibaraki, Japan
fDate :
7/1/1998 12:00:00 AM
Abstract :
It is theoretically and experimentally shown that Fresnel end reflection at a waveguide under test can degrade the sensitivity of an optical low-coherence reflectometer (OLCR) with a balanced detection scheme. Optical mixing of the local oscillator (LO) light and the end reflection produces beat noise whose current noise spectral density is represented by 2(1+P2)⟨I1⟩⟨I2 ⟩/δν, where P and δν are the degree of polarization and the effective linewidth of the light, respectively, and ⟨I2⟩ and ⟨I2⟩ are the total mean photocurrents of the LO light and the end reflection at the balanced mixer, respectively. The balanced detection technique suppresses the intensity noise of the light and the beat noise becomes the dominant source of sensitivity degradation. The minimum detectable reflectivity is derived which includes the effect of sensitivity degradation caused by beat noise
Keywords :
light polarisation; optical noise; optical testing; optical waveguides; reflectivity; reflectometry; sensitivity; spectral line breadth; Fresnel end reflection; balanced detection scheme; balanced detection technique; balanced mixer; beat noise; current noise spectral density; degree of polarization; effective linewidth; end reflection; intensity noise suppression; local oscillator light; minimum detectable reflectivity; optical low-coherence reflectometer; optical low-coherence reflectometry noise; sensitivity; sensitivity degradation; total mean photocurrents; waveguide under test; Acoustic reflection; Degradation; Fresnel reflection; Optical mixing; Optical noise; Optical reflection; Optical sensors; Optical waveguide theory; Optical waveguides; Reflectometry;
Journal_Title :
Quantum Electronics, IEEE Journal of