DocumentCode :
1397728
Title :
Radio-frequency measurements on transistors
Author :
Hyde, F.J.
Volume :
106
Issue :
17
fYear :
1959
fDate :
5/1/1959 12:00:00 AM
Firstpage :
942
Lastpage :
944
Keywords :
characteristics measurement; transistors;
fLanguage :
English
Journal_Title :
Proceedings of the IEE - Part B: Electronic and Communication Engineering
Publisher :
iet
ISSN :
0369-8890
Type :
jour
DOI :
10.1049/pi-b-2.1959.0175
Filename :
5244088
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1397728
