Title :
The measurement of transistor characteristics at very high frequencies
fDate :
5/1/1959 12:00:00 AM
Abstract :
The paper is concerned with the evaluation of transistors suitable for use as small-signal v.h.f. amplifiers. Parameters governing behaviour at very high frequencies are discussed and measurement techniques are described. Results of measurements at 100 Mc/s on two types of v.h.f. transistor are given; from these data, maximum available power gains are calculated and compared with values measured in a practical amplifier circuit.
Keywords :
characteristics measurement; transistors;
Journal_Title :
Proceedings of the IEE - Part B: Electronic and Communication Engineering
DOI :
10.1049/pi-b-2.1959.0176