• DocumentCode
    1397736
  • Title

    The measurement of transistor characteristics at very high frequencies

  • Author

    Bagley, J.H.

  • Volume
    106
  • Issue
    17
  • fYear
    1959
  • fDate
    5/1/1959 12:00:00 AM
  • Firstpage
    945
  • Lastpage
    950
  • Abstract
    The paper is concerned with the evaluation of transistors suitable for use as small-signal v.h.f. amplifiers. Parameters governing behaviour at very high frequencies are discussed and measurement techniques are described. Results of measurements at 100 Mc/s on two types of v.h.f. transistor are given; from these data, maximum available power gains are calculated and compared with values measured in a practical amplifier circuit.
  • Keywords
    characteristics measurement; transistors;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEE - Part B: Electronic and Communication Engineering
  • Publisher
    iet
  • ISSN
    0369-8890
  • Type

    jour

  • DOI
    10.1049/pi-b-2.1959.0176
  • Filename
    5244089