DocumentCode :
1397736
Title :
The measurement of transistor characteristics at very high frequencies
Author :
Bagley, J.H.
Volume :
106
Issue :
17
fYear :
1959
fDate :
5/1/1959 12:00:00 AM
Firstpage :
945
Lastpage :
950
Abstract :
The paper is concerned with the evaluation of transistors suitable for use as small-signal v.h.f. amplifiers. Parameters governing behaviour at very high frequencies are discussed and measurement techniques are described. Results of measurements at 100 Mc/s on two types of v.h.f. transistor are given; from these data, maximum available power gains are calculated and compared with values measured in a practical amplifier circuit.
Keywords :
characteristics measurement; transistors;
fLanguage :
English
Journal_Title :
Proceedings of the IEE - Part B: Electronic and Communication Engineering
Publisher :
iet
ISSN :
0369-8890
Type :
jour
DOI :
10.1049/pi-b-2.1959.0176
Filename :
5244089
Link To Document :
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