• DocumentCode
    1397791
  • Title

    Detecting stress and fatigue cracks

  • Author

    Huber, C. ; Zoughi, R.

  • Author_Institution
    Appl. Microwave Nondestructive Testing Lab., Colorado State Univ., Fort Collins, CO, USA
  • Volume
    15
  • Issue
    4
  • fYear
    1996
  • Firstpage
    20
  • Lastpage
    24
  • Abstract
    Discoveries in using open ended rectangular waveguides for microwave surface crack detection and sizing have generated interest. The foundation, potential, advantages and disadvantages of this methodology, developed at the Applied Microwave Nondestructive Testing Laboratory in the Electrical Engineering Department at Colorado State University, are discussed. Microwave techniques in general and this particular approach offer certain unique advantages that can advance the state of the art of fatigue/surface crack detection. The basic features and capabilities of this technique have been theoretically and experimentally investigated these past few years. However, more developmental work is needed to bring this technique from the laboratory to the real testing environment. The microwave method described has proven to be very effective in detecting and characterizing surface cracks in metals. It is inexpensive and can readily be applied in various environments. This approach applies to exposed, empty, filled and covered cracks. Cracks may also be detected remotely (i.e. the use on a liftoff in between the waveguide aperture and the surface under examination)
  • Keywords
    crack detection; crazing; metals; microwave measurement; nondestructive testing; rectangular waveguides; stress analysis; Applied Microwave Nondestructive Testing Laboratory; Colorado State University; NDT; covered cracks; empty cracks; exposed cracks; fatigue crack detection; fatigue/surface crack detection; filled cracks; metals; microwave method; microwave surface crack detection; microwave surface crack sizing; microwave techniques; nondestructive testing; open ended rectangular waveguides; stress crack detection; testing environment; waveguide aperture; Computer vision; Fatigue; Laboratories; Microwave generation; Microwave theory and techniques; Nondestructive testing; Rectangular waveguides; Stress; Surface cracks; Surface waves;
  • fLanguage
    English
  • Journal_Title
    Potentials, IEEE
  • Publisher
    ieee
  • ISSN
    0278-6648
  • Type

    jour

  • DOI
    10.1109/45.539960
  • Filename
    539960