Title :
Environmental effects on the growth of excess reverse current in germanium pߝn junctions
fDate :
5/1/1959 12:00:00 AM
Abstract :
An experimental study is described of the effect of various forms of surface contamination upon the slow growth of excess reverse current in germanium p-n junctions (´creep effect´).
Keywords :
semiconductor junctions;
Journal_Title :
Proceedings of the IEE - Part B: Electronic and Communication Engineering
DOI :
10.1049/pi-b-2.1959.0179
