Title :
Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out
Author :
Seong, Nak Hee ; Woo, Dong Hyuk ; Lee, Hsien-Hsin S.
Abstract :
As dynamic RAM scaling approaches its physical limit, phase-change memory is the most mature and well-studied option for potential DRAM replacement. However, malicious wear-out attacks can exploit PCM´s limited write endurance. To address this, a low-cost wear-leveling scheme can dynamically randomize the data addresses across the entire address space and obfuscate their actual locations from users and system software.
Keywords :
phase change memories; security of data; storage allocation; systems software; address space; data address; dynamic RAM scaling approach; malicious wear out; phase change memory protection; potential dram replacement; system software; wear leveling scheme; dynamic address remapping; phase change memory; security; wear leveling;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.2010.101