Title :
Voltage Noise in Production Processors
Author :
Reddi, Vijay Janapa ; Kanev, Svilen ; Kim, Wonyoung ; Campanoni, Simone ; Smith, Michael D. ; Wei, Gu-Yeon ; Brooks, David
Abstract :
Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.
Keywords :
computer architecture; coprocessors; integrated circuit design; integrated circuit noise; multiprocessing systems; processor design; production core 2 duo processor; resilient architecture design; voltage noise; Software thread scheduling; dI/dt; inductive noise; processor design; voltage margins;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.2010.104
