DocumentCode :
1398691
Title :
Electrical breakdown in germanium p-n junction
Author :
Yamaguchi, Jiro ; Hamakawa, Yoshihiro
Author_Institution :
Osaka University, Engineering, Osaka, Japan
Volume :
106
Issue :
15
fYear :
1959
fDate :
5/1/1959 12:00:00 AM
Firstpage :
353
Lastpage :
356
Abstract :
When square-wave pulses of 5¿160 microsec duration with a repetition rate of 1000 pulses/sec are applied in the reverse direction across a germanium grown p-n junction, the critical voltage of avalanche inception rises with the temperature of the specimen. The temperature coefficient is estimated to be about 8 × 10-4 per deg C, and the maximum field intensity in the junction is about 265 kV/cm. On the other hand, the turn-over voltage decreases markedly with the increasing ambient temperature of the specimens and duration of the pulses. The barrier temperature at turn-over is considered by the two methods for grown-junction and point-contact diodes. One is based on the temperature dependence of the reverse saturation current, which is measured at the interval of applied pulse, and the other is on the turn-over power at different ambient temperatures. From these experimental results it is concluded that there may be non-uniformity of junction or patch in the high electric field, and turn-over occurs when the barrier temperature reaches the intrinsic temperature at any spot in the junction.
Keywords :
electric breakdown; semiconductor junctions;
fLanguage :
English
Journal_Title :
Proceedings of the IEE - Part B: Electronic and Communication Engineering
Publisher :
iet
ISSN :
0369-8890
Type :
jour
DOI :
10.1049/pi-b-2.1959.0080
Filename :
5244247
Link To Document :
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