A Framework for Broadband Characterization of Individual Nanowires

Author

Kim, Kichul ; Wallis, T. Mitch ; Rice, Paul ; Chiang, Chin-Jen ; Imtiaz, Atif ; Kabos, Pavel ; Filipovic, Dejan S.

Author_Institution

Dept. of Electr., Comput., & Energy Eng., Univ. of Colorado, Boulder, CO, USA

Volume

20

Issue

3

fYear

2010

fDate

3/1/2010 12:00:00 AM

Firstpage

178

Lastpage

180

Abstract

A framework for broadband characterization of individual nanowires (NWs) is discussed in this letter. Specifically, on-wafer multiline thru-reflect-line (TRL) measurements, finite element modeling, and specially fabricated test structures with both extremely high and low impedances are jointly used to validate the feasibility of both measurements and modeling for characterizing small components. The test structures are designed as coplanar waveguide (CPW) devices with 100 nm and 250 nm diameter platinum (Pt) NWs. Though it is not possible to distinguish between the conductivity of the wire and contact resistances, we determine a range for conductivity and contact resistance over wide microwave bandwidth by minimizing the standard deviation between the measurements and full-wave modeling.

Keywords

contact resistance; coplanar waveguide components; finite element analysis; nanowires; broadband characterization; contact resistance; coplanar waveguide devices; finite element modeling; individual nanowires; on-wafer multiline thru-reflect-line measurements; Conductivity; contact resistance; coplanar waveguide (CPW); nanowires;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2010.2040224

Filename

5401078