• DocumentCode
    1398919
  • Title

    Using system-level models to evaluate I/O subsystem designs

  • Author

    Ganger, Gregory R. ; Patt, Yale N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    47
  • Issue
    6
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    667
  • Lastpage
    678
  • Abstract
    We describe a system-level simulation model and show that it enables accurate predictions of both I/O subsystem and overall system performance. In contrast, the conventional approach for evaluating the performance of an I/O subsystem design, which is based on standalone subsystem models, is often unable to accurately predict performance changes because it is too narrow in scope. In particular, conventional methodology treats all I/O requests equally, ignoring differences in how individual requests´ response times affect system behavior (including both system performance and the subsequent I/O workload). We introduce the concept of request criticality to describe these feedback effects and show that real I/O workloads are not approximated well by either open or closed input models. Because conventional methodology ignores this fact, it often leads to inaccurate performance predictions and can thereby lead to incorrect conclusions and poor design choices. We illustrate these problems with real examples and show that a system-level model, which includes both the I/O subsystem and other important system components (e.g., CPUs and system software), properly captures the feedback and subsequent performance effects
  • Keywords
    digital simulation; performance evaluation; systems analysis; I/O subsystem designs evaluation; overall system performance; performance effects; performance evaluation; standalone subsystem models; system behavior; system performance; system-level model; system-level models; system-level simulation model; Central Processing Unit; Computational modeling; Computer Society; Computer simulation; Delay; Feedback; Particle measurements; Predictive models; System performance; Throughput;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.689646
  • Filename
    689646