DocumentCode
1398993
Title
Field impoverishment modes in a diode with an AlxGa1-xAs/GaAs heterojunction: a simulation analysis
Author
Fernandes, C.F. ; Santos, H.A.
Author_Institution
Electr. Meas. Lab., Inst. Superior Tecnico, Lisboa, Portugal
Volume
138
Issue
1
fYear
1991
fDate
2/1/1991 12:00:00 AM
Firstpage
91
Lastpage
96
Abstract
The authors have examined previously the possibility of the formation of low-field domains as opposed to the traditional high-field domains found in Gunn diodes. Initial electron distributions that may lead to the growth of these domains are now further examined by numerical simulation with the purpose of finding conditions that are easier to meet in practice. It is confirmed that a significant number of electrons in the upper valleys is a necessary condition. However, it is found that the charge neutrality, uniform distribution in physical space, and direction of the wave number that were imposed in the previous simulation are not determinant. A AlxGa1-xAs(n)/GaAs(n) abrupt heterojunction is studied next in the frame of the Boltzmann transport equation. It is predicted that it may be used as an electron launcher into upper valleys for impoverishment field domains, provided the composition makes the ternary compound an indirect band gap semiconductor. When the injection guarantees 50% of the electrons in the satellite valleys at the heterojunction plane, the authors´ results show that, at a distance of 0.25 μm from the heterojunction interface, as much as 30% of the total number of electrons remains in the upper valleys. A diode that exhibits the formation of repetitive transit time field impoverishment modes is proposed
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; semiconductor device models; semiconductor diodes; simulation; AlxGa1-xAs-GaAs; Boltzmann transport equation; abrupt heterojunction; electron launcher; impoverishment field domains; indirect band gap semiconductor; numerical simulation; repetitive transit time field impoverishment modes; satellite valleys; simulation analysis; ternary compound; upper valleys;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings G
Publisher
iet
ISSN
0956-3768
Type
jour
Filename
87817
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