• DocumentCode
    1399011
  • Title

    Applying the Model-View-Controller Paradigm to Adaptive Test

  • Author

    Kupp, Nathan ; Makris, Yiorgos

  • Volume
    29
  • Issue
    1
  • fYear
    2012
  • Firstpage
    28
  • Lastpage
    35
  • Abstract
    The paper states that adaptive testing has been a focus area for IC testing in the last few years. The “Model-View-Controller”(MVC) architecture has the potential to improve engineering productivity for analysis and application of Adaptive Testing.
  • Keywords
    electronic engineering computing; integrated circuit testing; software architecture; IC testing; MVC architecture; adaptive testing; engineering productivity; integrated circuit testing; model-view-controller paradigm; Adaptation models; Adaptive systems; Analytical models; Data models; Semiconductor device modeling; Testing; Adaptive test; MVC; analog and RF test; yield learning;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2011.2179370
  • Filename
    6104214
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1399011