Title :
Charge injection of analogue CMOS switches
Author :
Eichenberger, C. ; Guggenbühl, W.
Author_Institution :
HMT Microelectron. AG, Brugg, Switzerland
fDate :
4/1/1991 12:00:00 AM
Abstract :
The clock-feedthrough phenomenon in sample-and-hold circuits using complementary MOS transistor switches is discussed in detail. The analysis starts with a generalised clock-feedthrough formula for the single MOS switch and is extended to a discussion of the basic CMOS sample-and-hold circuit operated over a wide signal and clock delay range. Simple formulas for the estimation of the clock feedthrough voltages are given. Experimental results obtained with custom integrated test chips realised with a 3 μm CMOS process are reported and found to be in good agreement with the theory. Simultaneous switching of transistor pairs with identical geometry at slow speed is recommended for optimal clock-feedthrough performance in CMOS switches
Keywords :
CMOS integrated circuits; clocks; sample and hold circuits; switched capacitor networks; 3 micron; analogue CMOS switches; clock delay range; clock-feedthrough phenomenon; custom integrated test chips; geometry; sample-and-hold circuits; slow speed; transistor pairs;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings G