Title :
Tuning Support Vector Machines for Minimax and Neyman-Pearson Classification
Author :
Davenport, Mark A. ; Baraniuk, Richard G. ; Scott, Clayton D.
Author_Institution :
Dept. of Stat., Stanford Univ., Stanford, CA, USA
Abstract :
This paper studies the training of support vector machine (SVM) classifiers with respect to the minimax and Neyman-Pearson criteria. In principle, these criteria can be optimized in a straightforward way using a cost-sensitive SVM. In practice, however, because these criteria require especially accurate error estimation, standard techniques for tuning SVM parameters, such as cross-validation, can lead to poor classifier performance. To address this issue, we first prove that the usual cost-sensitive SVM, here called the 2C-SVM, is equivalent to another formulation called the 2nu-SVM. We then exploit a characterization of the 2nu-SVM parameter space to develop a simple yet powerful approach to error estimation based on smoothing. In an extensive experimental study, we demonstrate that smoothing significantly improves the accuracy of cross-validation error estimates, leading to dramatic performance gains. Furthermore, we propose coordinate descent strategies that offer significant gains in computational efficiency, with little to no loss in performance.
Keywords :
error analysis; estimation theory; minimax techniques; pattern classification; statistical analysis; support vector machines; 2C-SVM; 2nu-SVM parameter; Neyman-Pearson classification; SVM classifiers; cost sensitive SVM; cross validation; error estimation; minimax criteria; support vector machine tuning; Computational efficiency; Costs; Design optimization; Error analysis; Minimax techniques; Performance gain; Performance loss; Smoothing methods; Support vector machine classification; Support vector machines; Minimax classification; Neyman-Pearson classification; error estimation; parameter selection.; support vector machine;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2010.29