A hysteresis model for an orthogonal thin-film magnetometer

Author

De Ridder, Rene M. ; Fluitman, Jan H.

Author_Institution

Dept. of Electr. Eng., Twente Univ., Enschede, Netherlands

Volume

26

Issue

4

fYear

1990

fDate

7/1/1990 12:00:00 AM

Firstpage

1237

Lastpage

1245

Abstract

The operation of a ferromagnetic thin-film magnetometer using the anisotropic magnetoresistance effect in a permalloy film is discussed. Measurements showed the presence of a hysteresis effect not predicted by available models. It is shown that the sensitivity of the magnetometer is predicted by applying F.S. Greene and R.B. Yarbrough´s (1970) orthogonal susceptibility model, and that the hysteresis can be explained by assuming dispersion in the magnitude of anisotropy. The orthogonal susceptibility model must be evaluated numerically, accounting for a finite driving field. The effect of an inhomogeneous demagnetizing field in the film is discussed in relation to magnitude dispersion of the anisotropy

Keywords

Permalloy; ferromagnetic properties of substances; magnetic hysteresis; magnetic susceptibility; magnetic thin film devices; magnetometers; anisotropic magnetoresistance effect; anisotropy magnitude dispersion; ferromagnetic thin-film magnetometer; hysteresis model; inhomogeneous demagnetizing field; orthogonal susceptibility model; permalloy film; sensitivity; Anisotropic magnetoresistance; Helium; Hysteresis; Magnetic anisotropy; Magnetic films; Magnetometers; Perpendicular magnetic anisotropy; Predictive models; Saturation magnetization; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.54014

Filename

54014