Title :
Measurement of noise source impedance of SMPS using two current probes
Author :
See, K.Y. ; Yang, L.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
fDate :
10/12/2000 12:00:00 AM
Abstract :
Using two clamp-on current probes, a novel method for measuring the common-mode (CM) and differential-mode (DM) noise source impedance of a switched mode power supply (SMPS) is developed. With proper setup calibration, the method is capable of measuring a wide range of impedance values with good accuracy
Keywords :
circuit testing; electric impedance measurement; probes; switched mode power supplies; SMPS; clamp-on current probes; common-mode noise source impedance; differential-mode noise source impedance; noise source impedance measurement; switched mode power supply;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20001284
