Title :
All-GaAs/AlGaAs readout circuit for quantum-well infrared detector focal plane array
Author :
Umansky, Vladimir ; Bunin, Gregory ; Gartsman, Konstantin ; Sharman, Charles ; Almuhannad, R. ; Heiblum, Moty ; Bar-Joseph, Isreal ; Meirav, U.
Author_Institution :
Dept. of Condensed Matter, Weizmann Inst. of Sci., Rehovot, Israel
fDate :
11/1/1997 12:00:00 AM
Abstract :
We report the fabrication and testing of an all-GaAs/AlGaAs hybrid readout circuit operating at 77 K designated for use with an GaAs/AlGaAs background-limited quantum-well infrared photodetector focal plane array (QWIP FPA). The circuit is based on a direct injection scheme, using specially designed cryogenic GaAs/AlGaAs MODFET´s and a novel n+ -GaAs/AlGaAs/n+-GaAs semiconductor capacitor, which is able to store more than 15 000 electrons/μm2 in a voltage range of ±0.7 V. The semiconductor capacitor shows little voltage dependence, small frequency dispersion, and no hysteresis. We have eliminated the problem of low-temperature degradation of the MODFET I-V characteristics and achieved very low gate leakage current of about 100 fA in the subthreshold regime. The MODFET electrical properties including input-referred noise voltage and subthreshold transconductance were thoroughly tested. Input-referred noise voltage as low as 0.5 μV/√Hz at 10 Hz was measured for a 2×30 μm2 gate MODFET. We discuss further possibilities for monolithic integration of the developed devices
Keywords :
HEMT integrated circuits; III-V semiconductors; aluminium compounds; focal planes; gallium arsenide; infrared detectors; leakage currents; photodetectors; semiconductor device noise; semiconductor quantum wells; -0.7 to 0.7 V; 100 fA; 77 K; GaAs-AlGaAs; III-V semiconductors; MODFET I-V characteristics; background-limited quantum-well infrared photodetector; direct injection scheme; focal plane array; frequency dispersion; gate leakage current; hybrid readout circuit; input-referred noise voltage; low-temperature degradation; semiconductor capacitor; subthreshold regime; subthreshold transconductance; Capacitors; Circuit testing; Fabrication; Gallium arsenide; HEMTs; Infrared detectors; MODFET circuits; Quantum wells; Semiconductor device noise; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on