• DocumentCode
    1399737
  • Title

    All-GaAs/AlGaAs readout circuit for quantum-well infrared detector focal plane array

  • Author

    Umansky, Vladimir ; Bunin, Gregory ; Gartsman, Konstantin ; Sharman, Charles ; Almuhannad, R. ; Heiblum, Moty ; Bar-Joseph, Isreal ; Meirav, U.

  • Author_Institution
    Dept. of Condensed Matter, Weizmann Inst. of Sci., Rehovot, Israel
  • Volume
    44
  • Issue
    11
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    1807
  • Lastpage
    1812
  • Abstract
    We report the fabrication and testing of an all-GaAs/AlGaAs hybrid readout circuit operating at 77 K designated for use with an GaAs/AlGaAs background-limited quantum-well infrared photodetector focal plane array (QWIP FPA). The circuit is based on a direct injection scheme, using specially designed cryogenic GaAs/AlGaAs MODFET´s and a novel n+ -GaAs/AlGaAs/n+-GaAs semiconductor capacitor, which is able to store more than 15 000 electrons/μm2 in a voltage range of ±0.7 V. The semiconductor capacitor shows little voltage dependence, small frequency dispersion, and no hysteresis. We have eliminated the problem of low-temperature degradation of the MODFET I-V characteristics and achieved very low gate leakage current of about 100 fA in the subthreshold regime. The MODFET electrical properties including input-referred noise voltage and subthreshold transconductance were thoroughly tested. Input-referred noise voltage as low as 0.5 μV/√Hz at 10 Hz was measured for a 2×30 μm2 gate MODFET. We discuss further possibilities for monolithic integration of the developed devices
  • Keywords
    HEMT integrated circuits; III-V semiconductors; aluminium compounds; focal planes; gallium arsenide; infrared detectors; leakage currents; photodetectors; semiconductor device noise; semiconductor quantum wells; -0.7 to 0.7 V; 100 fA; 77 K; GaAs-AlGaAs; III-V semiconductors; MODFET I-V characteristics; background-limited quantum-well infrared photodetector; direct injection scheme; focal plane array; frequency dispersion; gate leakage current; hybrid readout circuit; input-referred noise voltage; low-temperature degradation; semiconductor capacitor; subthreshold regime; subthreshold transconductance; Capacitors; Circuit testing; Fabrication; Gallium arsenide; HEMTs; Infrared detectors; MODFET circuits; Quantum wells; Semiconductor device noise; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.641346
  • Filename
    641346