Title :
A new charge conserving capacitance model for GaAs MESFET´s
Author :
Nawaz, Muhammad ; Fjeldly, Tor A.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
fDate :
11/1/1997 12:00:00 AM
Abstract :
We present a new charge conserving capacitance model for Gallium-Arsenide (GaAs) metal semiconductor field effect transistors (MESFET´s) based on the quasi-static approximation and a proper partitioning of the channel charge between the source and the drain terminals. A total of nine so-called transcapacitances were determined by taking derivatives of the various terminal charges with respect to the voltages at source, drain, and gate. The transcapacitances are nonreciprocal, i.e., Cij≠Cji when i≠j, and can be organized in a 3×3 matrix incorporating Kirchhoff´s current law (charge conservation) and independence of reference. The present capacitance model is valid both above and below threshold, and shows good agreement with experimental data over a wide range of gate and drain biases. The model is analytical and suitable for implementation in circuit simulators
Keywords :
III-V semiconductors; Schottky gate field effect transistors; capacitance; circuit CAD; circuit analysis computing; gallium arsenide; semiconductor device models; GaAs; Kirchhoff´s current law; MESFET; channel charge partitioning; charge conservation; charge conserving capacitance model; circuit simulators; drain biases; gate biases; nonreciprocal transcapacitances; quasi-static approximation; threshold; Analytical models; Capacitance; Circuit simulation; Computational modeling; FETs; Gallium arsenide; MESFETs; Physics; Solid modeling; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on