• DocumentCode
    1399960
  • Title

    Optimal information-dispersal for increasing the reliability of a distributed service

  • Author

    Sun, Hung-Min ; Shieh, Shiuh-Pyng

  • Author_Institution
    Dept. of Inf. Manage., Chaoyang Univ. of Technol., Taichung, Taiwan
  • Volume
    46
  • Issue
    4
  • fYear
    1997
  • fDate
    12/1/1997 12:00:00 AM
  • Firstpage
    462
  • Lastpage
    472
  • Abstract
    This paper investigates the (m,n) information dispersal scheme (IDS) used to support fault-tolerant distributed servers in a distributed system. In an (m,n)-IDS, a file M is broken into n pieces such that any m pieces collected suffice for reconstructing M. The reliability of an (m,n)-IDS is primarily determined by 3 important factors: n=information dispersal degree (IDD), n/m=information expansion ratio (IER), Ps=success-probability of acquiring a correct piece. It is difficult to determine the optimal IDS with the highest reliability from very many choices. Our analysis shows: several novel features of (m,n)-IDS which can help reduce the complexity of finding the optimal IDS with the highest reliability; that an IDS with a higher IER might not have a higher reliability, even when Ps→1. Based on the theorems given herein, we have developed a method that reduces the complexity for computing the highest reliability from, O(ν) [ν=number of servers] to O(1) when the `upper bound of the IER´=1, or O(ν2) to O(1) when the `upper bound of the IER´>1
  • Keywords
    client-server systems; fault tolerant computing; security of data; (m,n) information dispersal scheme; correct piece acquisition; distributed service; distributed system; fault-tolerant distributed servers; information dispersal degree; information expansion ratio; optimal information-dispersal; reliability increase; security; success-probability; Authentication; Costs; Fault tolerance; Fault tolerant systems; File servers; Information analysis; Intrusion detection; Polynomials; Secure storage; Upper bound;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.693779
  • Filename
    693779