• DocumentCode
    1400011
  • Title

    Modeling of light-addressable potentiometric sensors

  • Author

    Colalongo, Luigi ; Verzellesi, Giovanni ; Passeri, Daniele ; Lui, A. ; Ciampolini, Paolo ; Rudan, Massimo V.

  • Author_Institution
    Dipt. di Matematica, Trento Univ., Italy
  • Volume
    44
  • Issue
    11
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    2083
  • Lastpage
    2090
  • Abstract
    In this paper, the extension of numerical simulation techniques to the analysis of light-addressable potentiometric sensors (LAPS) is discussed in detail. To this purpose, proper physical models of both the ion-sensitive and the photo-sensitive transduction mechanisms have been incorporated into the framework of a general-purpose device simulator. A self-consistent, accurate picture of charge transport within the device under the combined action of electrolyte ion layers and of luminous stimulus is recovered, which in turn allows for detailed analysis of the device behavior and for fine-tuning of the fabrication process. Extensive comparison with actual LAPS measurement has been performed, validating the tool and illustrating its flexibility and application range
  • Keywords
    chemical sensors; electrochemical analysis; hole density; intelligent sensors; microsensors; numerical analysis; photoconducting devices; semiconductor device models; HFIELDS; charge transport; electrolyte ion layers; electrolyte-insulator-semiconductor system; fabrication process; general-purpose device simulator; hole density distribution; ion-sensitive transduction mechanism; light-addressable potentiometric sensors; luminous stimulus; numerical simulation techniques; photosensitive transduction mechanism; physical models; smart chemical sensor; Capacitors; Electric fields; Electrodes; Fabrication; Insulation; Integrated circuit measurements; Numerical simulation; Photoconductivity; Semiconductor device measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.641388
  • Filename
    641388