• DocumentCode
    1400101
  • Title

    A complete procedure for residual generation and evaluation with application to a heat exchanger

  • Author

    Peng, Youbin ; Youssouf, Abdelillah ; Arte, Philippe ; Kinnaert, Michel

  • Author_Institution
    Lab. d´´Autom., Univ. Libre de Bruxelles, Belgium
  • Volume
    5
  • Issue
    6
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    542
  • Lastpage
    555
  • Abstract
    In this paper, we will build up the link between parity relation design and residual evaluation via generalized likelihood ratio (GLR) test. To this end, the so-called single-sensor parity relation (SSPR) and single-actuator parity relation (SAPR) are refined for stochastic systems in frequency domain by including a whitening filter. This result is also extended to the generalized parity relations in order to detect any failure mode. The proposed design procedure not only achieves failure detection and isolation, but also generates a special residual form which can be evaluated by a GLR test. Besides, a comprehensive summary of the GLR test with rules of thumb to select the design parameters is provided. The effectiveness of the proposed procedure is illustrated by processing measured data from a pilot heat exchanger to detect sensor faults, and by performing a simulation study to detect actuator faults
  • Keywords
    actuators; fault diagnosis; fault location; heat exchangers; process control; stochastic systems; actuator faults; frequency domain; generalized likelihood ratio test; heat exchanger; parity relation design; residual evaluation; residual generation; sensor faults; simulation study; single-actuator parity relation; single-sensor parity relation; stochastic systems; whitening filter; Actuators; Fault detection; Filters; Frequency domain analysis; Performance evaluation; Redundancy; Stochastic systems; System testing; Thermal sensors; Thumb;
  • fLanguage
    English
  • Journal_Title
    Control Systems Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-6536
  • Type

    jour

  • DOI
    10.1109/87.641400
  • Filename
    641400