Title :
Transient switching behavior of the resonant-tunneling diode
Author :
Kluksdahl, N.C. ; Kriman, A.M. ; Ferry, David K. ; Ringhofer, C.
Author_Institution :
Center for Solid State Electron. Res., Arizona State Univ., Tempe, AZ, USA
Abstract :
A quantum mechanical analysis is used to treat the transient behavior of the resonant-tunneling diode (RTD). The use of the Wigner formalism permits inclusion of the quantum mechanics inherent in the device, while offering a Boltzmann-like equation that is rather easily implemented. Self-consistent treatment of the potential introduces plasma oscillations in the distribution, which leads to the oscillatory current transient. Fourier analysis of this transient indicates that the RTD behaves inductively at frequencies under 2 THz, consistent with the ballistic nature of the carriers. At higher frequencies, the dominant mechanism is the capacitive charging and discharging of the quantum well, which leads to capacitive behavior of the device. The real part of the conductance is negative for frequencies under 1.5 THz, and positive for higher frequencies. The critical frequencies are shown to be independent of the relaxation time used to model dissipation, although the magnitude of the conductance decreases as the dissipation increases.<>
Keywords :
semiconductor device models; semiconductor diodes; solid-state microwave devices; 1.5 THz; 2 THz; Boltzmann-like equation; Fourier analysis; MM-wave devices; RTD; THF; Wigner formalism; ballistic transport; capacitive charging; capacitive reactance; critical frequencies; dissipation; inductive reactance; model; negative conductance; oscillatory current transient; plasma oscillations; quantum mechanical analysis; quantum mechanics; quantum well; relaxation time; resonant-tunneling diode; transient behavior; transient switching behaviour; Boltzmann equation; Electrons; Energy states; Gallium arsenide; Plasmas; Poisson equations; Quantum mechanics; Resonance; Resonant tunneling devices; Semiconductor diodes;
Journal_Title :
Electron Device Letters, IEEE