DocumentCode :
1400292
Title :
700-V asymmetrical 4H-SiC gate turn-off thyristors (GTO´s)
Author :
Agarwal, A.K. ; Casady, J.B. ; Rowland, L.B. ; Seshadri, S. ; Siergiej, R.R. ; Valek, W.F. ; Brandt, C.D.
Author_Institution :
Div. of Electron. Senors & Syst., Northrop Grumman Sci. & Technol. Centre, Pittsburgh, PA, USA
Volume :
18
Issue :
11
fYear :
1997
Firstpage :
518
Lastpage :
520
Abstract :
Silicon Carbide (4H-SiC), asymmetrical gate turn-off thyristors (GTO´s) were fabricated and tested with respect to forward voltage drop (V/sub F/), forward blocking voltage, and turn-off characteristics. Devices were tested from room temperature to 350/spl deg/C in the dc mode. Forward blocking voltages ranged from 600-800 V at room temperature for the devices tested. V/sub F/ of a typical device at 350/spl deg/C was 4.8 V at a current density of 500 A/cm2. Turn-off time was less than 1 μs. Although no beveling or advanced edge termination techniques were used, the blocking voltage represented approximately 50% of the theoretical value when tested in an air ambient. Also, four GTO cells were connected in parallel to demonstrate 600-V, 1.4 A (800 A/cm2) performance.
Keywords :
power semiconductor switches; semiconductor device testing; silicon compounds; thyristors; wide band gap semiconductors; 1 mus; 1.4 A; 25 to 350 C; 4.8 V; 600 to 800 V; DC power switching; GTO cell packaging; SiC; air ambient; asymmetrical 4H-SiC GTO thyristors; current density; dc mode; device testing; forward I-V characteristics; forward blocking voltage; forward voltage drop; gate turn-off thyristors; turn-off characteristics; turn-off time; Breakdown voltage; Conducting materials; Current density; Schottky diodes; Silicon carbide; Substrates; Temperature; Testing; Thermal conductivity; Thyristors;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.641431
Filename :
641431
Link To Document :
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