DocumentCode :
1400394
Title :
Ultra-high-speed digital circuit performance in 0.2- mu m gate-length AlInAs/GaInAs HEMT technology
Author :
Mishra, Umesh K. ; Jensen, Joseph F. ; Brown, April S. ; Thompson, M.A. ; Jelloian, L.M. ; Beaubien, Randall S.
Author_Institution :
Hughes Aircraft Co., Malibu, CA, USA
Volume :
9
Issue :
9
fYear :
1988
Firstpage :
482
Lastpage :
484
Abstract :
The fabrication of fifteen-stage ring oscillators and static flip-flop frequency dividers with 0.2- mu m gate-length AlInAs/GaInAs HEMT technology is described. The fabricated HEMT devices within the circuits demonstrated a g/sub m/ transconductance of 750 mS/mm and a full-channel current of 850 mA/mm. The measured cutoff frequency of the device is 120 GHz. The shortest gate delay measured for buffered-FET-logic (BFL) ring oscillators at 300 K was 9.3 ps at 66.7 mW/gate (fan-out=1); fan-out sensitivity was 1.5 ps per fanout. The shortest gate delay measured for capacitively enhanced logic (CEL) ring oscillators at 300 K was 6.0 ps at 23.8 mW/gate (fan-out=1) with a fan-out sensitivity of 2.7 ps per fan-out. The CEL gate delay reduced to less than 5.0 ps with 11.35-mW power dissipation when measured at 77 K. The highest operating frequency for the static dividers was 26.7 GHz at 73.1 mW and 300 K.<>
Keywords :
III-V semiconductors; aluminium compounds; dividing circuits; field effect integrated circuits; flip-flops; gallium arsenide; high electron mobility transistors; indium compounds; integrated circuit technology; integrated logic circuits; invertors; oscillators; 0.2 micron; 11.35 to 66.7 mW; 120 GHz; 26.7 GHz; 300 K; 5 to 9.3 ps; 73.1 mW; 77 K; AlInAs-GaInAs; BFL; CEL; HEMT technology; buffered-FET-logic; capacitively enhanced logic; cutoff frequency; fabrication; fan-out; fan-out sensitivity; fifteen-stage ring oscillators; full-channel current; gate delay; highest operating frequency; power dissipation; static flip-flop frequency dividers; submicron devices; transconductance; Cutoff frequency; Delay; Digital circuits; Fabrication; Flip-flops; Frequency conversion; Frequency measurement; HEMTs; Ring oscillators; Transconductance;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.6952
Filename :
6952
Link To Document :
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