DocumentCode
140060
Title
Disease state fingerprint for fall risk assessment
Author
Simila, Heidi ; Immonen, Milla
Author_Institution
VTT Tech. Res. Centre of Finland, Espoo, Finland
fYear
2014
fDate
26-30 Aug. 2014
Firstpage
3176
Lastpage
3179
Abstract
Fall prevention is an important and complex multifactorial challenge, since one third of people over 65 years old fall at least once every year. A novel application of Disease State Fingerprint (DSF) algorithm is presented for holistic visualization of fall risk factors and identifying persons with falls history or decreased level of physical functioning based on fall risk assessment data. The algorithm is tested with data from 42 older adults, that went through a comprehensive fall risk assessment. Within the study population the Activities-specific Balance Confidence (ABC) scale score, Berg Balance Scale (BBS) score and the number of drugs in use were the three most relevant variables, that differed between the fallers and non-fallers. This study showed that the DSF visualization is beneficial in inspection of an individual´s significant fall risk factors, since people have problems in different areas and one single assessment scale is not enough to expose all the people at risk.
Keywords
accident prevention; biomechanics; data analysis; data visualisation; diseases; drugs; geriatrics; mechanoception; medical diagnostic computing; medical disorders; patient diagnosis; risk analysis; ABC scale score; BBS score; Berg balance scale score; DSF algorithm application; DSF visualization; activities-specific balance confidence scale score; disease state fingerprint algorithm; drug number; elderly fall prevention; fall history; fall patient identification; fall risk assessment data; holistic fall risk factor visualization; nonfaller differentiation; physical functioning; Aging; Diseases; Fingerprint recognition; Muscles; Risk management; Sociology; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1557-170X
Type
conf
DOI
10.1109/EMBC.2014.6944297
Filename
6944297
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