• DocumentCode
    1400882
  • Title

    Very sensitive measurement method of electron devices current noise

  • Author

    Macucci, M. ; Pellegrini, B.

  • Author_Institution
    Scuola Superiore di Studi Univ. Perfezionamento, Pisa, Italy
  • Volume
    40
  • Issue
    1
  • fYear
    1991
  • fDate
    2/1/1991 12:00:00 AM
  • Firstpage
    7
  • Lastpage
    12
  • Abstract
    The problem of measuring very low levels of current noise in bipoles (linear or not) is dealt with, and a measurement technique is proposed. This technique allows the measurement of noise power spectra 6-10 dB lower than the equivalent input power spectrum of the amplified necessary to perform the measurement. An improvement of 16-20 dB in the sensitivity is obtained with respect to the one of conventional methods, which, for an acceptable accuracy, require the noise of the bipole under test to be 10 dB larger than the equivalent input one of the amplifier. The present method is based on the accurate measurement of the amplifier transimpedance with respect to the input current noise sources and on the precise evaluation and subtraction of the contribution from all the spurious sources to the total noise. The whole procedure is implemented by means of a dual-channel signal analyzer and almost completely automated. The technique has been tested by using it to measure the power spectra of the noise given by known generators, of the Nyquist noise produced by bipoles made up of resistors and capacitors, and of shot noise in p-n junctions. The experimental results agree very well with theoretical predictions
  • Keywords
    electric noise measurement; electron device noise; spectral analysis; Nyquist noise; amplifier transimpedance; bipoles; capacitors; dual-channel signal analyzer; electron devices current noise; input current noise sources; p-n junctions; power spectra; resistors; shot noise; subtraction; Current measurement; Electron devices; Measurement techniques; Noise generators; Noise level; Noise measurement; Performance evaluation; Power measurement; Signal analysis; Testing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.69940
  • Filename
    69940