Title :
On the constant diagnosability of baseline interconnection networks
Author :
Nuang, W. ; Lombardi, F.
Author_Institution :
Dept. of Electr. Eng., Fudan Univ., Shanghai, China
fDate :
12/1/1990 12:00:00 AM
Abstract :
A novel approach for the diagnosis of baseline interconnection networks with a fan-in/fan-out of 2 is presented. The totally exhaustive combinatorial fault model with single fault assumption is used in the analysis. Some new characteristics of baseline interconnection networks are proved. A characterization for the fault location and the fault type of the one-response fault are given. This characterization is used in proving that baseline interconnection networks with fan-in/fan-out of 2 can be diagnosed with a constant number of tests independent of the network size. The maximum number of tests is 12
Keywords :
fault tolerant computing; multiprocessor interconnection networks; parallel processing; baseline interconnection networks; combinatorial fault model; constant diagnosability; fan-in/fan-out; one-response fault; Computer networks; Fault diagnosis; Fault location; Fault tolerant systems; Instruction sets; Multiprocessor interconnection networks; Packet switching; Parallel processing; Testing; Throughput;
Journal_Title :
Computers, IEEE Transactions on
