DocumentCode
1401355
Title
Long lossy lines (L3) and their impact upon large chip performance
Author
Davidson, Evan E. ; McCredie, Bradley D. ; Vilkelis, Walter V.
Author_Institution
IBM Corp., Poughkeepsie, NY, USA
Volume
20
Issue
4
fYear
1997
fDate
11/1/1997 12:00:00 AM
Firstpage
361
Lastpage
375
Abstract
The semiconductor industry expects the performance of microprocessors to continue at its current rate of improvement; i.e. clock rates should double every two to three years. This is a commendable goal but it is also fair to question whether this is an achievable goal. The fundamental problem is that as groundrules are reduced, the natural tendency is to make smaller conductor cross-sectional areas. The result is a high resistance line that exhibits slow wave propagation effects. This reduces the general performance expectations. As circuits become faster and denser on the chip, line delays become greater than expected. This problem is analyzed and potential chip and packaging solutions are offered. Clock rate predictions for various design and process options are made. A tactical recommendation to consider a total packaged electronics solution is presented
Keywords
delays; integrated circuit interconnections; integrated circuit packaging; microprocessor chips; multichip modules; probability; statistical analysis; timing; clock rate predictions; conductor cross-sectional area; large chip performance; line delays; long lossy lines; microprocessors; packaging; slow wave propagation effects; Circuits; Clocks; Conductors; Delay lines; Electronics industry; Electronics packaging; Extrapolation; Microprocessors; Performance loss; Process design;
fLanguage
English
Journal_Title
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1070-9894
Type
jour
DOI
10.1109/96.641504
Filename
641504
Link To Document