• DocumentCode
    1401355
  • Title

    Long lossy lines (L3) and their impact upon large chip performance

  • Author

    Davidson, Evan E. ; McCredie, Bradley D. ; Vilkelis, Walter V.

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • Volume
    20
  • Issue
    4
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    361
  • Lastpage
    375
  • Abstract
    The semiconductor industry expects the performance of microprocessors to continue at its current rate of improvement; i.e. clock rates should double every two to three years. This is a commendable goal but it is also fair to question whether this is an achievable goal. The fundamental problem is that as groundrules are reduced, the natural tendency is to make smaller conductor cross-sectional areas. The result is a high resistance line that exhibits slow wave propagation effects. This reduces the general performance expectations. As circuits become faster and denser on the chip, line delays become greater than expected. This problem is analyzed and potential chip and packaging solutions are offered. Clock rate predictions for various design and process options are made. A tactical recommendation to consider a total packaged electronics solution is presented
  • Keywords
    delays; integrated circuit interconnections; integrated circuit packaging; microprocessor chips; multichip modules; probability; statistical analysis; timing; clock rate predictions; conductor cross-sectional area; large chip performance; line delays; long lossy lines; microprocessors; packaging; slow wave propagation effects; Circuits; Clocks; Conductors; Delay lines; Electronics industry; Electronics packaging; Extrapolation; Microprocessors; Performance loss; Process design;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.641504
  • Filename
    641504